+*Deya Chen (Chengdu Huazhixing Electronic Technology Co., Ltd.), Feng Lan (University of Electronic Science and Technology of China), Hui Yuan (University of Electronic Science and Technology of China), Guopeng Chen (University of Electronic Science and Technology of China), Yanchu Liu (University of Electronic Science and Technology of China)

***, ***, +*Song Han (Zhejiang University)

Inti L. Ruiz (Universidad Nacional de Colombia), Syuzanna M. Asadulina (ITMO University), Juan P. Del Risco (Universidad Militar Nueva Granada), Julián D. Ortiz (Universidad de San Buenaventura), +*Juan Domingo Baena Doello (Universidad Nacional de Colombia)

Meline Grigoryan (Yerevan State University), +*Tatiana Orlova (Yerevan State University)

+*Natalya D. Osintseva (Budker Institute of Nuclear Physics SB RAS), Vasiliy V. Gerasimov (Budker Institute of Nuclear Physics SB RAS), Vladimir S. Pavelyev (Samara National Research University (Samara University))

+*Yanchu Liu (University of Electronic Science and Technology of China), Feng Lan (University of Electronic Science and Technology of China), Munan Yang (University of Electronic Science and Technology of China), Yueting Li (University of Electronic Science and Technology of China), Xiaolei Nie (University of Electronic Science and Technology of China), Jiayao Yang (University of Electronic Science and Technology of China), Hui Yuan (University of Electronic Science and Technology of China), Yaxin Zhang (University of Electronic Science and Technology of China), Ziqiang Yang (University of Electronic Science and Technology of China)

+Longhui Fang (University of Electronic Science and Technology of China), *Feng Lan (University of Electronic Science and Technology of China), Xiaolei Nie (University of Electronic Science and Technology of China), Hui Yuan (University of Electronic Science and Technology of China), Yaxin Zhang (University of Electronic Science and Technology of China), Ziqiang Yang (University of Electronic Science and Technology of China)

+Ze Yang Wen (University of Electronic Science and Technology of China), *Feng Lan (University of Electronic Science and Technology of China), Guopeng Chen (University of Electronic Science and Technology of China), Munan Yang (University of Electronic Science and Technology of China), Yaxin Zhang (University of Electronic Science and Technology of China), Ziqiang Yang (University of Electronic Science and Technology of China)

+Xuyu Liu (University of Electronic Science and Technology of China), *Feng Lan (University of Electronic Science and Technology of China), Jiayao Yang (University of Electronic Science and Technology of China), Yueting Li (University of Electronic Science and Technology of China), Yaxin Zhang (University of Electronic Science and Technology of China), Ziqiang Yang (University of Electronic Science and Technology of China)

+*Dmitry Krasnikov (Skolkovo Institute of Science and Technology), ***, ***, ***, ***, Albert G. Nasibulin (Skolkovo Institute of Science and Technology)